Abstract
This work presents the investigation of graphite and reduced graphene oxide (RGO) reflectance as an important parameter for electronic devices’ protection. These materials should protect electronic circuits against external as well as internal reflected radiation. The investigation was focused on comparing the reflectance of both materials on the metal layers. The measurements of constant electromagnetic parameters, such as permittivity and permeability, were carried out on pure materials without any additives, such as polystyrene foam, resin, wax, etc. The measurements were implemented in a coaxial line within the microwave frequency range from 100 MHz to 10 GHz. The measurements show a high value of reflected power, over 90% for graphite while RGO reflects only 80% of incident power. In addition, due to the half-wavelength effect in reduced graphene oxide, the reflection coefficient is reduced to 70%.
Highlights
Sensitive electronic devices and digital systems must be protected against harmful external electromagnetic radiation
This work presents the investigation of graphite and reduced graphene oxide reflectance
Due to the high electric constant, is a good absorber, it significantly suffers from excessive reflectivity
Summary
Sensitive electronic devices and digital systems must be protected against harmful external electromagnetic radiation. The electronic circuit is placed inside a metallic or metallic-like enclosure, which is a typical configuration giving, in many cases, rather poor protection against the external electromagnetic field Such an enclosure reflects incident radiation causing the internal as well as external reflected rays. Microwave absorbers are generally based on graphite and are provided in different structural forms such as nanotubes, nanowires or flakes [2,3,4] Such absorbers guarantee excellent electromagnetic protection properties due to the high value of electric losses. From this point of view, carbon-based materials have attracted the attention of many researchers in the manufacture of a variety of components for practical applications. The obtained data were used to investigate the reflectance of material slabs on conductive layers
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