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Abstract
Journal Article The collection of electron diffraction intensity data and their use in structure determination Get access J Gjonnes, J Gjonnes Center for Materials Science, University of Oslo, Gaustadalleen 21 N-0349 Oslo, Norway Search for other works by this author on: Oxford Academic Google Scholar V Hansen, V Hansen Stavanger University College, Departement of Technology and Natural Sciences, P.O. Box 2557 Ullandhaug N-4091 Stavanger, Norway Search for other works by this author on: Oxford Academic Google Scholar XZ Li XZ Li Walter Scott Engineering Center, University of Nebraska, Lincoln, NE 68588-0656. USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 100–101, https://doi.org/10.1017/S1431927602102017 Published: 01 August 2002
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