Abstract

AbstractLarge single crystals can be examined by conventional X-ray diffraction procedures only at their surface or by destructive sectioning. Within the limitations inherent in polychromatic X-ray photography, high-voltage Laue pictures arc shown to give some information on the internal quality of large crystals.Asterism in conventional Laue photographs is contrasted, with streaks due to geometric effects in Laue patterns of large crystals. Detail within the streaks reveals subgrain structure. A primary extinction effect can be used as striking proof of good crystals being capable of scattering coherently over large distances.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.