Abstract
Abstract The role of transmission electron microscopy (TEM) for the characterization of dislocations in materials has been extensively described in the literature (see, for example, Hirsch et al.1 and references therein). Previous studies of defects in organic molecular crystals have utilized etch-pit studies, x-ray topography and simple microscopic deformation.2 It is the purpose of this paper to indicate how TEM serves as a valuable addition to this list of techniques.3
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