Abstract
The chain method of LEED/MEED intensity analysis for metal surfaces is generalised to cover the case of insulators and semiconductors which have two non-equivalent atoms A and B per two-dimensional unit mesh. Some test calculations are performed for MgO(100) surface and the results are compared with those obtained from the layer-KKR method. It is found that the generalised chain formula is computationally fast for normal-incidence LEED and is particularly useful for off-normal LEED and MEED.
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