The bi-polar planar near-field measurement technique, part II: near-field to far-field transformation and holographic imaging methods

Abstract

A novel customized bi-polar planar near-field measurement technique is presented in a two-part paper. This bipolar technique offers a large scan plane size with minimal real-estate requirements and a simple mechanical implementation, requiring only rotational motions, resulting in a highly accurate and cost-effective antenna measurement and diagnostic system. Part I of this two-part paper introduced the bi-polar planar near-field measurement concept, discussed the implementation of this technique at the University of California, Los Angeles (UCLA), and provided a comparative survey of measured results. This paper examines the data processing algorithms that have been developed and customized to exploit the unique features of the bi-polar planar near-field measurement technique. Near-field to far-field transformation algorithms investigated include both interpolatory and non-interpolatory algorithms due to the a typical arrangement of the bi-polar near-field samples. The algorithms which have been tailored for the bi-polar configuration include the optimal sampling interpolation (OSI)/fast Fourier transform (FFT), Jacobi-Bessel transform, and Fourier-Bessel transform. Additionally, holographic imaging for determination of antenna aperture fields has been incorporated to facilitate antenna diagnostics. Results for a simulated measurement of an array of infinitesimal dipoles and a measured waveguide-fed slot array antenna are included. Appropriate guidelines with respect to the advantages and disadvantages of the various processing algorithms are provided. >