The behavior of microdisk and microring electrodes: Application of Neumann's integral theorem to the prediction of the steady state response of microdisks. Numerical illustrations

Abstract

We illustrate numerical examples of the application of Neumann's integral theorem to the steady state behavior of microdisk electrodes. Results obtained previously using other methods for uniform surface concentration and uniform flux boundary conditions are derived as limiting cases of a general equation which describes irreversible and quasi-reversible reaction kinetics. It is shown that the approach can be used to assess the effects of the tertiary current distribution. Comparisons are made with previous approximate analyses.