Abstract

A combination of LEED, AES, TDS and WF measurements was used to study the adsorption of Cs on the basal plane of MoS 2 between 140 and 330 K. The results showed that at low coverage ( θ < 0.1) Cs absorbed with a sticking coefficient of 0.40 independent of substrate temperature and formed strongly ionized isolated adatoms as on metals and other semiconductors. Above θ ∼ 0.1, Cs began to form 2D clusters and the behavior depended on temperature. At 170 K, the growing clusters began to coalesce at θ ∼ 0.60 and became 3D as θ increased from 0.80 to 1.6. At 330 K, coalescence occurred at θ ∼ 0.40 and saturation of the 3D clusters at θ ∼ 0.90. The behaviour at θ > 0.1 is in contrast to the uniform adsorption exhibited by Cs on metal and other semiconductors.

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