Abstract
Atomic force microscopy (AFM) is a relatively new tool in the study of materials used in the nuclear track methodology. The sensitivity to detect ionizing nuclear particles is strongly influenced by the surface roughness of the material used as detector. In this contribution a surface analysis of several commercial polycarbonates used as nuclear track detectors is presented.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have