The asymmetrically cut Bonse–Hart X-ray diffractometer. II. Comparison with the Kratky camera

Abstract

The asymmetrically cut, optimized BH diffractometer for small-angle X-ray scattering experiments is compared with the Kratky camera. It is shown that a crossover point exists in the resolution so that at a lower resolution the Kratky camera is superior and at a higher resolution the BH system is preferable. The crossover point depends on the number of reflections used. Methods of reducing the spurious signal and increasing the S/N ratio of the BH system are also discussed.