Abstract
Optical subsurface damage (SSD), generated from traditional grinding and polishing process, is prone to lower the laser-induced damage threshold (LIDT) of optical elements. Due to the fact that SSD elimination is on the premise of SSD evaluation, numerous SSD characterizing techniques have been proposed in the past few decades. In this paper, various SSD evaluations based on chemical etching technique are described and compared.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.