The application of the Device-Mission System in assessing single event effect rates in the current space industry

Abstract

This paper addresses current industry needs in the prediction of single event effect (SEE) rates of devices selected for space use, with particular attention to the use of commercial technologies. Impacts of the 'better, faster, cheaper' philosophy on current methods to ensure survivability in the space environment are also discussed. The Device-Mission System is presented as a tool for assessing on-orbit single event effect rates of commercial devices, or of parts with unknown internal geometries. Two applications are presented: the first provides the use of the Device-Mission System to predict on-orbit SEE rates; and the second presents a trade study of microprocessors for SEE sensitivity. The Device-Mission System is shown to enable both device-specific analysis, as well as rapid candidate device comparison. In both cases, the device and the mission environment are viewed together in one system, and the behavior of the system is addressed. (Author)