The application of the convolution relations in the X-ray line breadth analysis. III

Abstract

For pt.II see ibid., vol.9, no.4, p.593 (1976). Direct evaluations of the particle size L and strain parameters e are made following an iterative method. The expression derived previously for the observed integral breadth on the basis of simultaneous convolutions of the Gaussian instrumental profile with Schoening's true diffraction profile (which originates from a Cauchy particle size profile and a Gaussian strain profile) is considered for this purpose. The agreements of both L and e values evaluated directly with the predetermined ones have been found to be fairly good and this conforms with the observations made previously.