Abstract
Multiple diffraction using parallel-beam synchrotron X-radiation is described. Data recorded on the Daresbury Synchrotron Radiation Source from a single-crystal of InSb are presented and compared with data recorded with the pseudo-Kossel technique. The wide-beam synchrotron technique has demonstrated for the first time the feasibility of the synchrotron radiation multiple-diffraction topographic technique. Potential applications for this technique in the characterization of low-dimensional structures are outlined.
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