Abstract
The application of fast atom bombardment secondary ion mass spectrometry (FAB-SIMS) with quadrupole mass analysis to the study of some of the common constituents present in epoxy adhesive formulations is described and the potential of the technique evaluated. The compounds investigated were Epikote 828 (mainly diglycidyl ether of bisphenol-A) and the cross-linking agent dicyandiamide. The characteristic secondary ion spectra recorded for both materials exhibited a number of identifiable and uniquely diagnostic signals, which should be of use in the study of surface and interface adhesive chemistry.
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