Abstract
Secondary ion mass spectroscopy (SIMS) was used to study the adsorption of carbon monoxide on polycrystalline nickel, copper, iron, palladium and tungsten foils. The results demonstrate the ability of SIMS to distinguish, qualitatively, between molecular and dissociative adsorption. A correlation between SIMS results and those obtained by infra-red spectroscopy for molecular adsorption is also suggested.
Published Version
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