The application of scanning probe microscopy in materials science studies

Abstract

The family of techniques known as scanning probe microscopy (SPM) was invented in 1981 by Binnig and Rohrer. The most common methods are scanning-tunneling microscopy, atomic-force microscopy (AFM), and near-fi eld scanning optical microscopy, although hundreds of other variants have since been developed. Regardless of the specifi c version, each applies the same basic concept: detecting interactions between a scannable nanoscale probe and a nearby surface in order to measure and/or map local surface properties. Atomic-force microscopy was designed for detecting and mapping tipsample forces. These include repulsive and attractive interactions such as van der Waals, electronic, and magnetic forces, though applications to detect chemical, thermal, acoustic, and a host of other properties have since been implemented. The concept also extends to lithography, whereby the probe is used to modify a surface through physical, electronic, chemical, or thermal means. The probe itself in AFM is generally a microfabricated tip at the end of an integrated cantilever. Static or intermittent contact forces between the tip apex and a surface are measured as corresponding shifts in the lever defl ection or the resonant frequency, respectively. Although the lever motion is generally nanoscale, it is nearly always amplifi ed by refl ecting focused light off of the lever The Application of Scanning Probe Microscopy in Materials Science Studies