Abstract
The interaction of trace gases in the near surface region of aerosols (ice, liquid acids, hydrates) is important for understanding environmental problems, such as the formation of the Ozone‐hole or global warming. Direct measurements of trace gas concentration profiles on materials such as ice can provide key data to understand the underlying physical chemistry. However, measurement of concentration profiles in the near surface region of volatile materials presents a significant analytical challenge due to the materials high vapor pressure. We use Rutherford Backscattering (RBS) to measure in situ elemental concentration profiles on high vapor pressure materials held in controlled atmospheres of water vapor and trace gases. HCl uptake experiments are presented and the HCl diffusion and solubility at temperatures around 200 K are determined.
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