The applicability of acoustic emission as a non-destructive test for hybrid microelectronic circuits: J. Savage, R. T. W. Morrison and R. E. Cooper. Proc. Internepcon UK '79 p. 192, Brighton (16–18 October 1979)

doi:10.1016/0026-2714(80)90751-9

The applicability of acoustic emission as a non-destructive test for hybrid microelectronic circuits: J. Savage, R. T. W. Morrison and R. E. Cooper. Proc. Internepcon UK '79 p. 192, Brighton (16–18 October 1979)

https://doi.org/10.1016/0026-2714(80)90751-9

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Journal: Microelectronics Reliability

Publication Date: Jan 1, 1980

#Applicability Of Acoustic Emission #Test For Circuits + Show 4 more

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The applicability of acoustic emission as a non-destructive test for hybrid microelectronic circuits: J. Savage, R. T. W. Morrison and R. E. Cooper. Proc. Internepcon UK '79 p. 192, Brighton (16–18 October 1979)

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