The Analysis on Transient-Induced Latch-up in output driver circuit

Qi Jiang Qi Jiang,Yang Wang Yang Wang,Xiangliang Jin Xiangliang Jin,Huihui Yuan Huihui Yuan

doi:10.1109/edssc.2014.7061158

The Analysis on Transient-Induced Latch-up in output driver circuit

Qi Jiang Qi Jiang, Yang Wang Yang Wang + Show 2 more

https://doi.org/10.1109/edssc.2014.7061158

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Publication Date: Jun 1, 2014

Affiliation: Xiangtan University

#Output Driver Circuit #Transient Induced Latch Up + Show 5 more

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Abstract

The occurrence of transient induced latch up (TLU) in output driver circuits is studied. A RS485 transceiver fabricated by a 0.5-μm CMOS process was used for a test chip, and the reason for TLU be induced in output driver circuit is analyzed in this paper, the latch-up and EMMI tests are taken to confirm the reason and position of latch-up.

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