Abstract
The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.
Highlights
The μmRIXS plane grating spectrometer consists of two parabolical mirrors with a plane grating in between
The photons are detected by a PHOTONIS multi channel pate (MCP) stack in combination with a RoentDek delay line detector DLD-120
The MCP channel diameter is 25 μm and the top MCP is coated with CsI to improve the quantum efficiency of the detektor
Summary
The μmRIXS plane grating spectrometer consists of two parabolical mirrors with a plane grating in between. The first mirror collects and collimates the radiation from the 1x4 μm[2] beamline microfocus on the sample onto the grating while the second mirror focusses the diffracted light onto the detector. The spectrometer houses two laminar grating structures on a common substrate: 1050 l/mm for high transmission and 4200 l/mm for high resolution.
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