Abstract
A new approach to the reliability modeling of fault masking systems is presented. In contrast to the models known in the literature the new model of system operation is constructed in the form of the sequence of events related to the number of redundant modules.Such an approach results in relatively simple expressions for both reliability and failure rate functions of the system. The appropriate results for a k-out-of-n:G system and its variations such as NMR and NMR/Simplex are derived. The problem of compensating logical faults is also considered.
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