The accurate determination of crystal orientation from field ion micrographs

Abstract

The field-ion image cannot be represented by a standard crystallographic projection but approximates closely to a projection which may be simply defined in terms of the standard projections. This special projection depends on the microscope geometry and for the particular geometry employed correction factors can be calculated for converting the field-ion image to a standard projection. Distortions in the image due to asymmetries in the specimen can be averaged out by plotting sufficient crystal planes. The overall accuracy of the method is to about ±2%.