Abstract
The 4-probe method for resistivity measurements on semiconductors, though widely used, is subject to various kinds of error which are more serious at the higher resistivities. In this paper the causes of error are elucidated, and the method is shown to be capable of accuracy provided suitable precautions are taken, namely: limiting the electric field at the centre probes to 100 mv mm-1; controlling the ambient temperature; and enclosing the measuring circuit in a separately balanced screen.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
