The 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2011)

Abstract

Measurement and instrumentation have long played an important role in production engineering, through supporting both the traditional field of manufacturing and the new field of micro/nanotechnology. Papers published in this special feature were selected and updated from those presented at The 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2011) held at KAIST, Daejeon, South Korea, on 29 June–2 July 2011. ISMTII 2011 was organized by ICMI (The International Committee on Measurements and Instrumentation), Korean Society for Precision Engineering (KSPE), Japan Society for Precision Engineering (JSPE), Chinese Society for Measurement (CSM) and KAIST. The Symposium was also supported by the Korea BK21 Valufacture Institute of Mechanical Engineering at KAIST.A total of 225 papers, including four keynote papers, were presented at ISMTII 2011, covering a wide range of topics, including micro/nanometrology, precision measurement, online & in-process measurement, surface metrology, optical metrology & image processing, biomeasurement, sensor technology, intelligent measurement & instrumentation, uncertainty, traceability & calibration, and signal processing algorithms. The organizing members recommended publication of updated versions of some of the best ISMTII 2011 papers in this special feature of Measurement Science and Technology.As guest editor, I believe that this special feature presents the newest information on advances in measurement technology and intelligent instruments from basic research to applied systems for production engineering. I would like to thank all the authors for their great contributions to this special feature and the referees for their careful reviews of the papers. I would also like to express our thanks and appreciation to the publishing staff of MST for their dedicated efforts that have made this special feature possible.