The 10th China Test Conference

Abstract

The 10th China Test Conference (CTC) was successfully held in Harbin, China, on 15–16 August 2018. As a biennial conference sponsored by the China Computer Federation (CCF), and organized by the CCF Technical Committee on Fault Tolerant Computing (TCFTC), the CTC was initiated in the year of 2000 in Beijing, China, by Prof. Xiaowei Li from the Institute of Computing Technology of Chinese Academy of Sciences (ICT-CAS) and his Chinese colleagues in the test area. The CTC started in the background when China was beginning to encourage the development of its own integrated circuit industry. The topics of the CTC include integrated circuit testing, verification, and validation; system and software testing; reliability and fault tolerance; and hardware security.