Abstract
Textured growth of Cerium oxide (CeO2) and 100% lattice matched (Eu0.893Yb0.107)2O3 buffer layers were investigated for YBCO coated conductors as cap layers on Gd2O3 thin films by chemical solution deposition technique. CeO2 is one of the most widely used cap layer for fabrication of coated conductors, especially when e‐beam evaporation technique is used for YBCO processing. (Eu0.893Yb0.107)2O3 was designed as a perfect lattice matched cap layer, and CeO2 and (Eu0.893Yb0.107)2O3 cap layers have been fabricated on biaxially textured Ni substrates by chemical solution deposition technique in our laboratory. This time we presented textured growth of CeO2 on a Gd2O3 thin film and textured growth of (Eu0.893Yb0.107)2O3 on the CeO2/Gd2O3/Ni buffer layers structure by chemical solution deposition technique.
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