Abstract
A methodology is presented to characterize the crystallographic texture of atomic configurations on the basis of Euler angles. Texture information characterized by orientation map, orientation distribution function, texture index, pole figure and inverse pole figure is obtained. The paper reports the construction and characterization of the texture of nanocrystalline configurations with different grain numbers, grain sizes and percentages of preferred orientation. The minimum grain number for texture-free configurations is ∼2500. The effect of texture on deducing grain size from simulated X-ray diffraction curves is also explored as an application case of texture analysis. In addition, molecular dynamics simulations are performed on initially texture-free nanocrystalline Ta under shock-wave loading, which shows a 〈001〉 + 〈111〉 double fiber texture after shock-wave compression.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
