Abstract

Abstract The orientation and texture of Cr(110) films on the basal plane of α-Al2O3 was investigated by transmission electron microscopy. The Cr was deposited via molecular beam epitaxy at a substrate temperature of 110 °C resulting in the formation of crystallites with columnar mophology. Two orientation relationships (OR) were observed between Cr(110) and α-Al2O3(0001): Cr[001] // α-Al2O3[ 1 10] and Cr[ 1 11] // α-Al2O3[ 1 10]. Each of these orientation relationships exhibited two variants which were rotated ±5.26° around the substrate normal. The orientation relationships can be rationalized on the basis of geometry, rotational symmetry and lattice mismatches of the Cr/(110)/α-Al2O3(0001) interface. The occurrence of all OR can be related to Nishiyama-Wassermann (NW) and Kurdjumov-Sachs (KS) orientations and are discussed with respect to previous experimental results and geometrical parameters of other bcc metals which were grown on α-Al2O3(0001).

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