Abstract
In Ni 3Al the cold-rolled Goss texture changed to a complicated one after primary recrystallization and returned to the original Goss during the subsequent grain growth, which can be referred to as the texture memory effect. In this study, we examined the evolution of grain orientations during the grain growth using the electron backscatter diffraction (EBSD) method. It was found that just after the primary recrystallization most of the grains had a 40°〈1 1 1〉 rotation relationship to the Goss texture, the remaining grains being Goss and other textures. The formation of the 40°〈1 1 1〉 rotated grains can be explained by a multiple twinning mechanism. In the grain growth, the Goss grains, which were surrounded by the 40°〈1 1 1〉 rotated grains, grew preferentially due to the high mobility of the 40°〈1 1 1〉 grain boundaries, leading to the texture memory effect.
Highlights
We have developed Ni3Al foils for high-temperature micro chemical devices [1,2,3,4,5,6]
In this heat treatment we found an interesting phenomenon on the texture evolution as follows [9]
We found that the primary recrystallization texture had the rotation relationship about with the rotation angle of 40 ̊ to the as-rolled texture
Summary
We have developed Ni3Al foils for high-temperature micro chemical devices [1,2,3,4,5,6]. The ductility improvement is ascribed to the high fraction of the low angle boundaries (LABs) and Є3 boundaries which are known crack-resistant [8]. In this heat treatment we found an interesting phenomenon on the texture evolution as follows [9]. In the subsequent grain growth, the textures completely return to the same {110} textures as the as-rolled ones, which can be designated as Texture memory effect. Such texture return has rarely been observed in Ni3Al as well as in other common metals. We present the texture evolution during the primary recrystallization and grain growth in the heavily cold-rolled Ni3Al single crystals
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