Abstract
In this paper, we describe the interferometric polarization microscope which is able to be sensitive to the orientation of individual grains. This measurement requires to reach the thermoelastic deformation in the grain which is produced by the absorption of a modulated laser beam, focused by the microscope. In addition, we successfully compared on a same zone our results about the orientation of nickel grains with an another technique called EBSP (Electron Back Scattered Pattern) that also provided the orientations of individual grains.
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