Abstract
Both randomly oriented and highly (220) textured thin films of zinc phosphide (Zn3P2) were grown by the close-space sublimation method. The effect of deposition parameters, such as pressure and substrate temperature, on the texture evolution has been established. It was found that the deposition temperature plays a dominant role in determining the preferred orientation whereas the ambient pressure (below 10 Torr) does not greatly affect the film texture. We further found that the microstrain changes from tensile at lower deposition temperatures to compressive at higher deposition temperatures. The preferred orientation also had a strong impact on the electrical resistivity of the films. The results provide guidance on the selection of substrate and deposition parameters to grow Zn3P2 thin films with desirable properties.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
