Abstract
Abstract Non-random distribution of orientations of crystallites in powder specimens or compact polycrystalline samples can influence almost all accurate diffraction measurements. This affects mainly quantitative phase analysis and structure determination because both these methods are based on intensities of reflections from a randomly oriented assembly of particles. However, a strongly preferred orientation (texture) also causes problems in phase identification, stress measure-ments and profile analysis, especially in thin films. On the other hand, as has been pointed out by Bunge et al.(1989), texture can also help to separate completely overlapped reflections, like 330 and 411 reflections in the cubic 1-brass structure, if the sample has an appropriate preferred orientation.
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