Texture defect inspection for silicon solar cell

Abstract

In order to detect texture defects of silicon solar cells,a texture defect detection method combining the steerable filters with Hough transform was proposed.After image edges were extracted by using the steerable filters,the direction of texture was determined through Hough transform.The steerable filters as the same angle as that of texture direction was adopted to filter texture image of silicon solar cell,which could eliminate the line-like textures and retain the characteristics of texture defects.Locations of texture defects were determined in the filtered image with texture defects by using the dual threshold method.Compared with Gabor filter and wavelet filter methods,the experimental results show that the steerable filter method can be more effective for detecting texture defects than Gabor filter and wavelet filter methods.