Abstract
This paper aims at investigating a method for detecting defects on textured surfaces using a support vector machines (SVM) classification approach with Gabor wavelet features. Instead of using all the filters in the Gabor wavelets, an adaptive filter selection scheme is applied to reduce the computational cost on feature extraction while keeping a reasonable detection rate. One-against-all strategy is adopted to prepare the training data for a binary SVM classifier that is learnt to classify pixels as defective or non-defective. Experimental results on comparison with other multiresolution features and the learning vector quantization (LVQ) classifier demonstrate the effectiveness of the proposed method on defect detection on textured surfaces.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.