Texture analysis of monofilamentary, Ag-sheathed (Pb,Bi) 2Sr 2Ca 2Cu 3O x tapes by electron backscatter diffraction (EBSD)

Abstract

Using automated orientation imaging, the grain orientations and texture of monofilamentary, Ag-sheathed (Pb,Bi) 2Sr 2Ca 2Cu 3O x (Bi-2223) tape is analysed in detail by means of electron backscatter diffraction (EBSD). The achieved high image quality of the Kikuchi patterns enables multi-phase scans including Bi-2223, Bi 2Sr 2CaCu 2O x , Bi 2Sr 2CuO x , (Sr,Ca) 14Cu 24O 41 and Ag to be performed. Two areas are selected for the EBSD analysis, one close to the silver sheath, the other located in the center of the sample. The grain orientation maps are presented for each phase separately allowing a new insight into the microtexture of Ag-sheathed Bi-2223 tapes. Furthermore, the EBSD analysis provides the possibility for a misorientation angle analysis within each individual phase.