Abstract
In recent work, various design techniques were applied to investigate the feasibility of controlling the bandwidth and bandshape profiles of tungsten/boron-carbon (W/B 4C) and tungsten/silicon (W/Si) multilayers for optimizing their performance in synchrotron radiation based angiographical imaging systems at 33 keV. Varied parameters included alternative spacing geometries, material thickness ratios, and numbers of layer pairs. Planar optics with nominal design reflectivities of 30–94% and bandwidths ranging from 0.6–10% were designed at the Stanford Synchrotron Radiation Laboratory, fabricated by the Ovonic Synthetic Materials Company, and characterized on Beam Line 4-3 at the Stanford Synchrotron Radiation Laboratory. In this paper we report selected results of these tests and review the possible use of the multilayers for determining optimal signal to noise vs artifact signal ratios in practical dual-energy digital subtraction angiography systems.
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