Abstract
This study focuses on testing the effects of one and several reflow processes on surface mount tantalum capacitor characteristics, especially in a humid environment. Effects on maximum voltage, moisture absorption, and durability in the standard 85/85 test were examined. Research was done by using a 0–90 V voltage test, a 100% RH moisture absorption test, and the standard 85/85 test. Results show that a reflow process weakens the characteristics of tantalum capacitors and also affects their moisture absorption. Several reflow processes have a greater effect. Possible reasons are discussed in this paper.
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