Testing technique for embedded ADC

Abstract

The paper deals with an improved technique for testing embedded analog-digital converters (EADC) as system objects with the dynamic nonlinear and stochastic properties. A proposed technique makes it possible to estimate the dynamic characterization parameters typical as for spectral domain as for histogram testing. The implementation of the testing technique that is described is based on a broadband test signal that simulates actual operating conditions of EADC. By changing the mode of the test-signal generation it may be possible to except masking of the signal knocked codes. The technique makes it possible to avoid the standard problems associated with precise estimation of the spectrum of a broadband signal. The proposed technique is well suited to the design for test (DFT) and built in self-test (BIST) schemes of integrated circuits including a digital processing unit with an on-chip ADC and DAC.