Testing schemes for FIR filter structures

Abstract

This paper presents a new pseudoexhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed to detect any combinational faults within the basic cell of the functional units occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudoexhaustive patterns to systematically test all FIR filter building blocks.