Testing CP and CPT violation in the neutral kaon system at a phi factory.

Abstract

A general discussion of the gamut of CP- and CPT-violation tests that can be performed at a high-luminosity \ensuremath{\varphi} factory is presented. The results of simulations of the expected time distribution patterns of events in such a \ensuremath{\varphi} factory are displayed. Furthermore, we demonstrate by means of a global fit to all distributions that, at a \ensuremath{\varphi} factory with a total integrated luminosity of ${10}^{40}$ ${\mathrm{cm}}^{\mathrm{\ensuremath{-}}2}$, it is possible to determine most of the presently measured CP- and CPT-violating parameters in the neutral kaon system to a considerably better (statistical) level than that of current measurements. Present tests of CPT violation are examined and are contrasted with what could be achieved at such a \ensuremath{\varphi} factory. While present data could mask a potentially large CPT violation, measurements at a \ensuremath{\varphi} factory will be able to disentangle all the CPT-violating quantities from each other, allowing one to test unambiguously each CPT-violating parameter to one part in ${10}^{4}$ and, in particular, to measure the mass difference between the ${\mathit{K}}^{0}$ and the K\ifmmode\bar\else\textasciimacron\fi{} $^{0}$ to one part in ${10}^{18}$ of their mass.