Testing and Characterization of Digital Video Devices Using an Advanced Analog VLSI Test System Architecture

Abstract

gandard video transmission tests such as those specified in NTC Report No.7 are applied to digital and mixed signal video devices to provide on-picture performance characterization using an advanced mixed-signal ATE architecture. Memory-based algorithmic video signal generation and DSP-based measurement techniques are used. Hardware and software tools for analyzing mixed-signal video devices are describe9 lntrocwction Today’s video consumer devices are comprised of analog and digital circuitry. Low cost A/D-D/A flash converters and high density, high speed digital devices have made consumer digital video a reality. Such mixed-signal devices are used in IDTV, consumer Pcs, CRT video monitors, and a variety of other consumer products. Analysis of these devices presents new testing challenges for device designers and test engineers. Current practice throughout the industry typically relies on standard test signals for analysis of analog video devices. Those techniques are convenient since there is a variety of benchtop equipment available on the market and the techniques themselves are well established and understood. There are, however some distinct disadvantages when those techniques are applied to testing digital and mixed-signal devices. Analog test equipment cannot be used to analyze digital video data. Logic analyzers and VLSI ATE do not provide test data in a form which is meaningful in terms of on-picture performance. Analyzing digital and analog video test signals for aberrations affecting on-screen performance becomes a difficult problem. The objective of this paper is to provide working examples to demonstrate techniques for testing mixed-signal video devices.