Testing Analog and Mixed-Signal Circuits with Built-In Hardware - A New Approach

Abstract

The subject paper aims to develop approach to testing analog and mixed-signal embedded cores-based system-on-chip (SOC) with built-in hardware. In particular, oscillation-based built-in self-test (OBIST) methodologies for testing analog parts in mixed-signal circuits are explored here. A major advantage of OBIST methods is that they do not require either stimulus generators or complex response analyzers, which makes them suitable for testing analog circuits in mixed-signal system-on-chip (SOC) environments. In this paper, analog circuit test techniques based on the principle of OBIST were implemented. Simulation results on some sample analog benchmark circuits are provided to demonstrate the feasibility of the proposed implementations