Abstract

MOSFET-based power electronics systems have high-reliability requirements, and a high-accuracy fault diagnosis method is necessary. However, imperfect conditions such as severe signal noise and poor consistency exist in actual products. Conventional fault diagnosis methods are difficult to identify faults accurately. This paper describes a simulation-based testability design method for batch products considering noise immunity. First, the components' soft and hard fault models are determined with failure mode and effect analysis (FMEA), and the circuit simulation model is constructed. Then, the fault injection simulation is performed to structure the dependency matrix. The test points scheme is selected and optimized by extracting noise immunity characteristics of different types of signals. Finally, a power distribution system is taken as a case study for the testability design method, and the effectiveness of the test points is evaluated through simulation and experiment verification.

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