Abstract
A multi-function memristive logic test unit based on Knowm memristor is designed and implemented to the memristive digital circuits testability design in this article. The single fault memristive digital circuit is analyzed, Boolean difference algorithm is applied to the memristive digital circuits to generate test patterns and determine the location of the fault nodes. The multi-function memristive logic test unit can realize different functions, combining Boolean difference to solve the problem of uncertain faults with the same test patterns, and improve the controllability and observability of memristive digital circuits. It is a new exploration in testability design of memristive digital circuits, which provides new ideas and development directions, and lays a foundation for the research on the testability design of multi fault memristor digital circuits.
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