Test strategy planning method for complex integrated circuits

Abstract

This paper describes an advanced test planning technique for integrated circuits (ICs) with high production volumes. Since the proportion of test costs is relatively high, with complexities of IC devices increasing, many different test methods must be taken into account to test an IC cheaply and accurately. Many test planning methods have been introduced in the past ten years or more, however, the trends of ICs is to become more and more complex with high production volumes. This paper is focused on current complex ICs such as microprocessors. It can predict the overall manufacturing cost in the early design stage, and help the manufacturer reduce the overall costs.