Abstract
The algorithm for detecting pattern-sensitive faults in memories, as presented by K.K. Salnja, K. Kinoshita (ibid., vol.34, no.3, p.284-7, 1985), is simplified. In addition, a new algorithm is presented which has a near optimal WRITE sequence.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
