Abstract
The CMS tracker will be equipped with 16,000 silicon microstrip detector modules covering a surface of approximately 220 m 2 . For quality control, a compact and inexpensive DAQ system is needed to monitor the mass production in industry and in the CMS production centres. To meet these requirements a set-up called APV Readout Controller (ARC) system was developed and distributed among all collaborating institutes to perform full readout tests of hybrids and modules at each production step. The system consists of all necessary hardware components, C++ based readout software using LabVIEW 1 1 LabVIEW is a product of National Instruments, Austin, USA. as graphical user interface and provides full database connection to track every single module component during the production phase. Two preseries of Tracker End Cap (TEC) silicon detector modules have been produced by the TEC community and tested with the ARC system at Aachen. The results of the second series are presented.
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