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Abstract
AbstractThe consistency of a recently proposed algorithm for background correction in XPS is studied, under variation of the XPS peak energy, by use of synchrotron radiation. Two approximations for the inelastic scattering properties of the solid are investigated. Both algorithms are found to account well for the variation in the inelastic scattering properties of the solid when the Au 4f XPS peak energy is varied. Small differences can be ascribed to the influence of surface excitations which are not included in the algorithm.
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