Test of a distribution for electron trap lifetimes in zns which is related to the maximum entropy principle

Abstract

Electron trap lifetimes in Group II-IV compounds are obtained by phase shift measurements under modulated u.v. irradiation. The choice of modulation frequency provides an efficient way to select electrons coming out of definite traps. From a Gaussian behaviour with respect to temperature of measured electron lifetimes τ i , the probabilities p i= τ i ∑ j τ j of traps selected by the frequency of are computed. Each term p i ln p i , is made part of a Shannon entropy function. Changing the modulation frequency changes the p i and provides different terms in the sum −∑ p i ln p i , which is maximal with respect to temperature. Applying Jaynes' principle and Bayes' rule, the spread of the trap depth distribution is obtained.